Photon Statistics of Incoherent Cathodoluminescence with Continuous and Pulsed Electron Beams

Photon bunching in incoherent cathodoluminescence (CL) spectroscopy originates from the fact that a single high-energy electron can generate multiple photons when interacting with material, thus, revealing key properties of electron–matter excitation. Contrary to previous works based on Monte Carlo modeling, here we present fully analytical model describing amplitude and shape second order autocorrelation function (g(2)(?)) for continuous pulsed beams. Moreover, extend analysis photon ultrashort pulses, which up 500 electrons per pulse excite sample within few picoseconds. We obtain simple equation relating strength (g(2)(0)) beam current, emitter decay lifetime, duration, case beams, excitation efficiency (?), defined as probability an creates at least one interaction emitter. The shows good agreement experimental data obtained InGaN/GaN quantum wells using continuous, ns-pulsed (using blanker) ps-pulsed photoemission) extract efficiencies 0.13 0.05 10 8 keV respectively, observe nonlinear effects play no compelling role, even after dense cascades wells.